Self Calibration Capacitance Meter

Izdanje: Naučna konferencija Uniteh 2010

Oblast: Electronics and Sensors

Stranice: 194-198

Apstrakt:
This paper describes a self calibration method for capacitance measurement on the base of MCU. The method uses a software calibration technique for first order errors elimination as: offset and gain error, error caused by supply voltage variations, uncertainty error of comparator’s threshold voltage and its temperature drift as well as uncertainty and temperature drift of resistance. The method do not removes absolute measurement error of capacitance of the reference capacitor. Remaining sources of errors can be leakage currents of I/O pins of MCU, nonlinearity of applied passive components and discrete quantization error of ±1 instruction cycle. The measurement resolution is 16 bits.
Ključne reči: MCU, capacitance, instruction cycle, timer, comparator, interrupt, DMM
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Preuzimanje citata:

BibTeX format
@article{article,
  author  = {A. Žorić, S. Obradović and �. Perišić}, 
  title   = {Self Calibration Capacitance Meter},
  journal = {Naučna konferencija Uniteh 2010},
  year    = 2010,
  pages   = {194-198}}
RefWorks Tagged format
RT Conference Proceedings
A1 Aleksandar Žorić
A1 Slobodan Obradović
A1 Đurđe Perišić
T1 Self Calibration Capacitance Meter
AD Naučna konferencija Unitech, Gabrovo, Bugarska
YR 2010
Unapred formatirani prikaz citata
A. Žorić, S. Obradović and . Perišić, Self Calibration Capacitance Meter, Naučna konferencija Unitech, 2010